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Memory Foam 2-inch Mattress Topper/ Contour Pillows

I was quite disappointed to discover that the 2″ Memory Foam Topper sold here on Overstock.com is actually only 1 7/16th inches! As soon as I unpacked it, I noticed that it was significantly smaller than my 2 1/2 inch memory foam topper, so I …

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

Measuring Instruments for Building Construction. Methods for Determining Accuracy in Use: Measuring Tapes

Buildings, Measuring instruments, Linear measuring instruments, Measuring tapes, Surveying instruments, Surveying equipment, Accuracy, Performance testing, Field testing, Length measurement, Mathematical calculations, Testing conditions, CONSTRUCTION

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

Workshop Appliances Including Descriptions of the Gauging and Measuring Instruments the Hand Cutting-Tools Lathes Drilling Planning and Other Machine-Tools Used by Engineers. by CPB Shelley … – CPB Shelley

Workshop Appliances Including Descriptions of the Gauging and Measuring Instruments the Hand Cutting-Tools Lathes Drilling Planning and Other Machine-Tools Used by Engineers. by CPB Shelley … – CPB Shelley

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

FLUKE MANUFACTURING 80PK22 K-TYPE IMMERSION PROBE

K-TYPE IMMERSION PROBE – USE AS A GENERAL PURPOSE PROBE INCLUDING LIQUIDS AND GELS – COMPATIBLE WITH K-TYPE TEMPERATURE MEASURING INSTRUMENTS – MEASUREMENT RANGE: -40 TO 982 DEGREES C (-40 TO 1800 DEGREES F)

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

Prior Art for US Pat App 20080059141

A method of generating a reference data of simulated-diffraction signals of a patterned structure for use in scatterometric measurement on patterned structures, said method comprising: associating hypothetical parameters with a hypothetical profile; …

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

Prior Art for US Pat App 20080059129

A method of generating a reference data of simulated-diffraction signals of a patterned structure for use in scatterometric measurement on patterned structures, said method comprising: associating hypothetical parameters with a hypothetical profile; …

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

Prior Art for US Pat App 20080043229

A monitoring station for use with a photocluster for monitoring a photolithography process applied to substrates, the monitoring station comprising: a supporting assembly for supporting the substrate, an optical unit adapted to collect light from …

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |

Prior Art for US Pat App 20080074665

A structure configured for overlay measurement on a sample, said structure comprising at least one pair of diffractive structures of predetermined geometries and with a predetermined lateral shift between them, diffraction of incident light from …

[ More ] January 10th, 2010 | No Comments | Posted in Hand Tools, Measuring Instruments |
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